6 Electronics Failures You Can Prevent with an Integrated Simulation Approach

Electronic devices today are remarkably reliable, but that reliability is no accident. It stems from skilled design and engineering and a rigorous design process powered by advanced simulation and multiphysics analysis. When companies skip or underinvest in simulation at the design stage, they take an enormous risk, often resulting in failures late in the design cycle, during testing, or in the field—where they're far more costly and damaging.

As devices become more compact, powerful, and precise, traditional single-domain analysis falls short. Most real-world failures arise from interactions between electrical, thermal, and mechanical domains.

This guide explores six real-world failure modes that can be prevented with an integrated, multiphysics simulation strategy. From thermal runaway to mechanical stress fractures to gradual deterioration due to multiphysics interactions, each example highlights how Altair® SimLab®, together with other Altair tools such as Altair® PSIM™ (power simulation) can help identify risks early, reduce costly redesigns, and ensure robust performance from the first prototype.